Test pin ICT LEENO OT841R-M1.7

SKU: OT841R-M1.7  
💌 A Sincere Note from Vector Vina:
Due to the nature of the Lenno ICT test probe product line, profit margins are extremely thin and market competition is fierce. From practical experience, we have found that orders placed through trading partners often struggle to maintain the most competitive pricing when reaching the end user, making successful transactions very difficult.

For this reason, to ensure optimal efficiency, Vector Vina kindly asks to only provide direct quotes to valued factories and manufacturing companies.

We sincerely hope our trading partners understand and sympathize with this decision without taking offense. Vector Vina always values every opportunity to connect and hopes to cooperate with you on other more suitable product lines. Thank you very much!

The OT841R-M1.7 ICT test probe by LEENO (South Korea) is a high-performance testing component specially designed for complex jigs and fixtures in the semiconductor and electronics industries. With absolute mechanical precision and stable signal transmission characteristics, the OT841R-M1.7 is the top choice for testing integrated circuits (ICs), high-density boards, and components requiring the highest reliability.

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LEENO OT841R-M1.7 ICT Probe Pin – High-Performance Specialized Testing Solution

For advanced testing applications such as IC testing or ultra-high-density circuit boards, selecting the right probe pin is critical to the success of the entire process. The LEENO OT841R-M1.7 ICT probe pin is engineered to meet the most stringent requirements, delivering performance and reliability that conventional products cannot match.

Manufactured by LEENO, a global leading brand from South Korea, the OT841R-M1.7 is crafted using advanced technology and premium materials, ensuring durable performance across millions of cycles.

Technical Specifications:

  • Product Code: OT841R-M1.7
  • Brand: LEENO
  • Origin: South Korea
  • Product Type: Pogo Pin / ICT Probe Pin / Semiconductor Test Probe
  • Application: Specially suited for testing semiconductors, integrated circuits (IC), and ultra-high-density circuit boards (PCB, FPC) requiring absolute precision.

Key Features of the LEENO OT841R-M1.7 Probe Pin:

  1. Specialized Design: Optimized for complex testing tasks demanding high electrical characteristics (low impedance, high bandwidth) and mechanical stability (durability, consistent spring force).
  2. LEENO Quality: Manufactured and quality-controlled under the highest South Korean standards, ensuring uniformity and reliability in every unit.
  3. Superior Durability: Advanced materials enable the probe pin to withstand high-intensity operating cycles, minimizing downtime for maintenance and replacement.
  4. Stable Signal: Optimized internal structure ensures accurate measurement signal transmission without attenuation, delivering reliable test results.

Choose the LEENO OT841R-M1.7 when your application allows no compromise on accuracy and reliability.

SKU: OT841R-M1.7 Category: ICT Pin

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