Test pin Leeno SG248R


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The OT841R-M1.7 ICT test probe by LEENO (South Korea) is a high-performance testing component specially designed for complex jigs and fixtures in the semiconductor and electronics industries. With absolute mechanical precision and stable signal transmission characteristics, the OT841R-M1.7 is the top choice for testing integrated circuits (ICs), high-density boards, and components requiring the highest reliability.
LEENO OT841R-M1.7 ICT Probe Pin – High-Performance Specialized Testing Solution
For advanced testing applications such as IC testing or ultra-high-density circuit boards, selecting the right probe pin is critical to the success of the entire process. The LEENO OT841R-M1.7 ICT probe pin is engineered to meet the most stringent requirements, delivering performance and reliability that conventional products cannot match.
Manufactured by LEENO, a global leading brand from South Korea, the OT841R-M1.7 is crafted using advanced technology and premium materials, ensuring durable performance across millions of cycles.
Technical Specifications:
Key Features of the LEENO OT841R-M1.7 Probe Pin:
Choose the LEENO OT841R-M1.7 when your application allows no compromise on accuracy and reliability.



