Test pin ICT LEENO OT841R-M1.7


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The G1353R ICT test probe by LEENO (South Korea) is a high-quality testing component specialized for jigs and fixtures in the electronics assembly and testing industry. Manufactured to LEENO's international standards, the product offers high precision, stable contact, and superior durability, making it an ideal solution for PCB and FPC testing applications.
LEENO G1353R ICT Probe Pin – Superior Durability and Performance from South Korea
Part of LEENO's diverse product portfolio, the G1353R ICT probe pin is a comprehensive and effective solution for In-Circuit Test (ICT) and Functional Test (FCT) requirements. With a globally established reputation, every product from LEENO, including the G1353R, represents South Korean precision, durability, and advanced technology.
The G1353R probe pin is engineered to operate durably in industrial manufacturing environments where hundreds of thousands of test cycles are required while maintaining stable performance.
Technical Specifications:
Key Features of the LEENO G1353R Probe Pin:
Choosing the LEENO G1353R ICT probe pin is a guarantee of quality and efficiency for your quality control line.



